Showing results: 616 - 630 of 843 items found.
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778572-35 -
NI
544-Crosspoint, 1-Wire PXI Matrix Switch Module—The PXI‑2535 is a high-density 4x136 PXI matrix switch module that is ideal for routing low-power DC signals in validation test systems of mass produced devices such as semiconductor chips and printed circuit boards (PCBs). Featuring field-effect transistor (FET) relays, the PXI‑2535 offers unlimited mechanical lifetime and switching speeds up to 50,000 crosspoints/s. It also features onboard relay counting for relay monitoring and deterministic operation with hardware triggers to improve test throughput.
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MCPS -
Test Electronics
The most important features of this burn in power supply is its ability to hold a constant output for each channel even in the event that a unit under test on one channel may short and fail. Since each channel has it''s own transformer, no glitches or voltage spikes can get into any of the other channels. This image shows the results as the second channel from the left is shorted with a small wire and the circuit breaker pops out. Used for burn-in testing and other timed testing where power isolation is required. Very basic simple circuit, see schematic below. Cleans and frees up benchtops, burn in racks and work space clutter. Available in benchtop or rackmount.
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Equip-Test Kft.
More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
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Raytheon Company
The Component Test and Analysis team specializes in electronic and mechanical components such as hybrids, connectors, cables, harnesses, passive or discrete components, and digital or linear devices. The test lab has extensive experience in developing test software to electrically and environmentally characterize virtually any integrated circuit, including analog, digital, mixed signal, converters, FPGA and ASICs, as well as experience in developing actual radiation environments for parts testing. The component analysis team offers the analytical expertise and advanced instrumentation to identify root cause explanation for a wide range of component-level failures, as well as the resources to evaluate for possible quality and reliability issues through non-destructive and destructive techniques. With access to a detailed database, the Component Test and Analysis team offers a 25-year history of test and analysis data — a valuable resource for addressing new customer requirements.
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J2110A -
PICOTEST Corp.
While it is possible to obtain high quality injection transformers with bandwidths as wide as 1Hz to 5MHz or more, in some cases this is still insufficient for some tests. For example a typical heater control loop might have a bandwidth of less than 1Hz while some linear regulators and opamp circuits can have bandwidths of up to 100MHz or in some cases even higher. For these applications, a solid state injector can provide the necessary bandwidth. A solid state injector can perform at DC, while the upper frequency limit is dictated by the components selected and the printed circuit board material and layout. It is possible to obtain a solid state injector with a working range of DC – 200MHz, though above 50MHz the interconnection between the injector and the circuit being tested can become quite critical. It is essential that ripple from the injector power supply does not dramatically degrade the dynamic range or the signal to noise ratio of the measurement. The resulting plots are often much cleaner when using a solid state injector than with a transformer injector.
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Materials Development Corporation
MDC announces the addition of software and hardware for copper diffusion studies to its CSM/Win suite of semiconductor test systems and software. This new CSM/Win feature plays an important part in the development of processes and materials for the next advance in integrated circuit technology that employscopper as a conductor. Special Current-Voltage Bias-Temperature Stress (IV-BTS) software can measure the degradation of insulator quality due to copper diffusion.Multiple test sites can be stressed with a constant voltage while the current through each site is measured and recorded. The Current-Voltage Bias-Temperature Stress test supplements conventional MOS C-V measurements and Triangular Voltage Measurements (TVS) that are also employed in copper diffusion studies.
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MPK-2000e -
MEGABRAS srl
The MPK-2000e digital very low resistance ohmmeter is a portable, microprocessor controlled instrument used to accurately measure resistances of switches and circuit breaker contacts, transformer and motor windings, wire and cable samples, joints in busbars, etc., using test currents from 1mA up to 10A. It uses the Kelvin-type, four-terminals measurement principle, thus eliminating errors caused by lead and contact resistances.
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1AC II -
Fluke Corporation
The portable 1AC II non-contact voltage tester from Fluke are easy to use – just touch the tip to a terminal strip, outlet, or supply cord. When the tip glows red and the unit beeps, you know there's voltage present. Electricians, maintenance, service, safety personnel, and homeowners can quickly test for energized circuits in the workplace or at home and even detect miswires of an electrical outlet.
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TCC 1800-UE -
TEST-OK BV
The TCC1800-UE Test Controller Card is a generic control board for production testing of printed circuit boards (PCBs). The board is controlled by a command language on a PC to which it is connected via Ethernet.The TCC1800-UE is designed to work with positive voltages up to 24V. The card provides extensive IO: Analog and digital interfacing, counters, PWM outputs, bidirectional I/O, ethernet-, CAN, USB, SPI and I2C interfacing.
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IPMDS100 -
Technology Research Corp.
- Intelligent Power Management System- 3 - 20 Amp Single Phase Outlets- 3 - 40 Amp Three Phase Outlets- 2 - 60 Amp Three Phase Outlets- Automatic Load Shedding- 100 Amp Mil Spec Input and Output Connector- Easy Access Circuit Breakers- Phase Over Current Protection- Low Voltage Warning- Built In Press to Test
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D2B -
Teradyne, Inc.
The unique capabilities of Teradyne's D2B software enable EMS and OEM manufacturers and partners to interconnect their global enterprises to optimize printed circuit board assembly test and inspection efficiencies early in the manufacturing / build cycle. D2B is a powerful suite of solutions that provides a standards-based architecture that supports GenCAM and ODB++ file formats enabling electronic manufacturers to outperform their competition, maximize profitability, and get to market first.
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ELES Semiconductor Equipment SpA
ELES designs and manufacturers reliability test solutions to verify the performance of integrated circuits from concept validation to high volume production during all the test phases. No other company can provide universal equipment for all the reliability tests, or can guarantee a seamless data flow between phases or can apply on chip embedded reliability engineering for data tracking and failure investigation. Clients use our functional test data to proactively analyse variations between lots, between temperature extremes and during lifetime (often these defects escape ATE). The improvements to products and processes needed to arrive at zero defects cannot be driven by the quantity of Big Data alone, the quality of reliability data is a strategic advantage that only ELES can provide.
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TS-217 -
Marvin Test Solutions, Inc.
The TS-217 is an I-level and Depot-level Universal Launcher test set supporting fighter aircraft launchers including the LAU-127, LAU-128, and LAU-129 (AMRAAM), LAU-117 and LAU-88 (Maverick), and LAU-7 (Sidewinder) missile launchers, launcher electronic assemblies, launcher power supplies, and circuit cards. The TS-217 is also used as a depot-level tester for F-18 armament including launchers (LAU-127, LAU-7, LAU-115, and LAU-116), bomb racks (BRU-32), and aircraft pylons (SUU-62 and SUU-63). Additionally, the TS-217 supports MAU-169 Paveway kits, subassemblies, and circuit cards. The TS-217 performs full parametric functional testing as well as troubleshooting to the faulty LRU (I-Level configuration) and SRU (Depot-Level configuration). The TS-217 can be used as an I-Level tester or as a Depot / Acceptance tester for launcher subassemblies.
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Santa Barbara Infrared, Inc.
The FPA Test Set (FPATS) interface to the detectors under test (DUT’s) is via a custom pedestal plate which provides both a conductive heat path to both the individual DUT’s as well as the field of view limiting aperture plate. This custom pedestal plate protrudes through the customer provided DUT interface printed circuit board (PCB) and makes physical contact with the rear of the DUT packages and the aperture plate when the FPATS is in the closed position. The pedestal plate is mounted to the ambient source plate and its temperature is actively driven by this subsystem.
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PPTM01AS -
Matco Tools
*Connects with the new Power Probe Tek application for greater diagnostic functionality*The Maestro and Power Probe Tek App will be compatible to connect with a majority of diagnostic scan tools*Trace mode offers scope-like functionality*Stream and record visual traces of electrical issues found when diagnosing*DC voltmeter with the capability of applying battery supplied voltage or ground*AC voltmeter: TRMS, peak-to-peak/min/max, frequency, duty cycle*Resistance testing with a live or unloaded circuit*Fuel-injector test mode*Driver test for testing module drivers
